By signing in, you agree to the Terms of Service and Privacy Policy.

YIELD INTELLIGENCE PLATFORM

From excursion alert to evidence package in 12 minutes.

Correlates KLARF, SPC, and FDC events automatically
On-premise, air-gapped — your wafer data stays in your facility
SECS/GEM integration in a single shift, no change control
2.1× Faster root-cause identification
97.3% Defect classification accuracy